岩井教授 論文一覧 | |
論文題目一覧(1976-2010) (PDF) |
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主な論文 |
□博士論文
2010年取得 博士論文一覧 | |
宋 在烈 | A Study on Gate-stack Process for Ge MOS Devices with La2O3Gate Dielectric |
2007年取得 博士論文一覧 | |
Joel Molina Reyes | A Study on the Reliability of Metal Gate–La2O3 Thin Film
Stacked Structures |
2006年取得 博士論文一覧 | |
黄仁安 | A Study on Mobility of MOSFETs with La2O3 Gate Dielectric |
百瀬寿代 | Study on si transistors with high performance and high reliability for CMOS/BiCMOS integrated circuits |
2005年取得 博士論文一覧 | |
金容湜 | Analysis of Electrical Conduction in Rare Earth Gate Dielectrics |
2004年取得 博士論文一覧 | |
戸野谷純一 | Study on Dry Etching for Profile and Selectivity Control in ULSI(Ultra-Large Scale Integrated Circuits) Manufacturing |
大島享介 | Application of High Dielectric Constant Thin Film for Advanced CMOS Devices |
2003年取得 博士論文一覧 | |
池田修二 | Tecnology for High-density and High-performance Static Random Access Memory |
2001年取得 博士論文一覧 | |
青木均 | A study on Accurate and Efficient Compact Models for New Components Used for Integrated Circuits |
土明正勝 | A study of Si/SiO2 Interfacial Properties for ULSI Fabrication |
□修士論文
2010年9月卒業 修士論文一覧 | |
Zade Darius | III-V MOSFETs: A Study on High-k Gate Dielectrics |
Mokhammad Sholihul Hadi | A Study on Electrical and Magnetic Characterization of Co87Zr5Nb8 Films for High-Q On-chip Inductors |
2009年9月卒業 修士論文一覧 | |
李 映勲 | Theoretical Study on Ballistic Transport Characteristics of Silicon Nanowire FETs |
2005年卒業 修士論文一覧 | |
小林洋一 | Formation of heat resistant Ni silicide by additional Hf layers
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佐藤貴久 | Effects of surface treatments on the retained dose of impurities for plasma doping |
ヘンドリアンシャー・サウッディン | Low-Frequency (1/f ) Noise of nMISFET with La2O3 High-k Gate Dielectrics and Analysis of Ultra-Shallow p+/n Junction Formed by Plasma Doping Method |
宮内邦裕 | Study on La2O3/Y2O3Stacked Gate Dielectrics |
吉田丈治 | The Process Dependence of Low-Frequency Noise in MOSFETS with La2O3 Gate Dieletrics |
2004年卒業 修士論文一覧 | |
上田功 | A study on High-k Stacked GAte Dielectric Thin films of Rare Earth Oxides |
栗山篤 | Effect of Post Metallization Annealing for La2O3 Thin Film |
2002年卒業 修士論文一覧 | |
佐藤航一郎 | Study on Pr2O3 Dielectric Thin Films for MOSFET Gate Insulator
Application |
武田光弘 | Study on Lu2O3 Thin Films for High-k Gate Insulator Application |
2001年卒業 修士論文一覧 | |
藤森亮介 | Analysis on high-k dielectric gate insulator MISFETs by two-dimensional device simulation |
□卒業論文
2011年卒業 卒業論文一覧 | |
久保田 透 | Estimation of Interface and Oxide Defects in Direct Contact High-k/Si Structure by Conductance Method |
2009年卒業 卒業論文一覧 | |
小柳 友常 | Electrical Characterization of La2O3-Gated MOSFET with Mg Incorporation |
2007年卒業 卒業論文一覧 | |
岡本晃一 | Electrical characteristics of La2O3 and HfO2 for gate oxide application |