218th ECS Meeting
発表資料一覧
Milam Kumar Bera
Electrical Properties of Yttrium-Titanium Oxide High-k Gate Dielectric on Ge
Maimaitirexiati Maimaiti
Effect of Remote-Surface-Roughness Scattering on Electron Mobility in MOSFETs with High-k Dielectrics
小柳 友常
Impact of Alkali-Earth-Elements Incorporation on V
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Roll-Off Characteristics of La
2
O
3
Gated MOS Device
茂森 直登
Suppression of Lateral Encroachment of Ni Silicide into Si Nanowires using Nitrogen Incorporation
呉 研
Observation of tunneling FET operation in MOSFET with NiSi/Si Schottky source/channel interface
来山 大祐
TiN Capping Effect on High Temperature Annealed RE-Oxide Devices for Scaled EOT